Return to JournalSeek Home

Genamics JournalSeek

IEEE Transactions on Device and Materials Reliability
IEEE Trans Device Mater Reliab

Published/Hosted by IEEE. ISSN: 1530-4388.

An on-line publication providing leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It will focus on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials. All issue topics are carefully chosen through the input of experienced professionals from both academic and industrial sectors. The manuscripts are passed through a special review process to ensure high technical content and that they are of interest to the special issue audience.

   Further information
   Category Link

Add To Favorites
Email This Page

Side Panel
Privacy Policy About Us Contact Us