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IEE Proceedings - Part A: Science, Measurement and Technology
Sci Meas Tech IEE Proc

Published/Hosted by The Institution of Electrical Engineers. ISSN: 0960-7641.

Discontinued in 1993. Continued by IEE Proceedings - Science, Measurement and Technology (1350-2344). The scope encompasses micro- and nanotechnology engineering, particularly nano/microdevice and microsystem applications in: imaging, remote-sensing, broadband wireless systems, optoelectronics, photonics, security, quantum electronics, consumer applications, aerospace, defence, data storage, microdisplays, field-emission devices, medical devices, microanalytical systems, spectroscopy, integrated micromechanical systems, microfluidics.

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