This international journal publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within these fields: -Electron and ion optics -microscopes and spectrometer techniqes -beam optics, geometrical optics, wave optics -imaging and image processing -holography and image formation -image analysis -optical communication and computing -ray optics, quantum optics -design and operation of laser optical systems -laser applications -nonlinear optics -physiological optics -atmospheric optics -wave propagation and transmission in homogeneous and inhomogeneous materials - information optics -optical elements, devices and systems -optical testing techniques -optical properties of materials -photoelectric and optoelectronic devices -optical instruments, and measuring techniques -as well as other related topics. It publishes original papers and short notes on theoretical and experimental research in English. Optik addresses itself especially to scientific and technical working specialists in this field. At the same time it is the official organ of the German Society for Electron Microscopy and the German Society for Applied Optics.
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